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传输线的随机建模及瞬态响应数值实验分析

张瑛 JanetM.Wang 肖亮 吴慧中

张瑛, JanetM.Wang, 肖亮, 吴慧中. 传输线的随机建模及瞬态响应数值实验分析[J]. 电子与信息学报, 2006, 28(8): 1516-1520.
引用本文: 张瑛, JanetM.Wang, 肖亮, 吴慧中. 传输线的随机建模及瞬态响应数值实验分析[J]. 电子与信息学报, 2006, 28(8): 1516-1520.
Zhang Ying, Janet M. Wang, Xiao Liang, Wu Hui-zhong. Stochastic Modeling for Transmission Lines and Numerical Experimental Analysis for Transient Simulation[J]. Journal of Electronics and Information Technology, 2006, 28(8): 1516-1520.
Citation: Zhang Ying, Janet M. Wang, Xiao Liang, Wu Hui-zhong. Stochastic Modeling for Transmission Lines and Numerical Experimental Analysis for Transient Simulation[J]. Journal of Electronics and Information Technology, 2006, 28(8): 1516-1520.

传输线的随机建模及瞬态响应数值实验分析

Stochastic Modeling for Transmission Lines and Numerical Experimental Analysis for Transient Simulation

  • 摘要: 该文考虑集成电路制造过程中传输线制造工艺参数随机扰动对传输线传输性能的影响,建立了传输线的随机模型,针对该模型提出了基于蒙特卡洛法的传输线瞬态响应统计分析方法。统计分析中采用精细积分算法求解传输线样本瞬态响应,并对模型输出的正态性进行偏度-峰度检验,给出了最差情况估计。试验结果表明该文提出的传输线随机模型及统计分析方法可以对传输线的传输性能进行有效的评估,对于传输线制造过程的控制及优化有着重要意义。
  • Khebir A. Higher order asymptotic boundary condition for thefinite element modeling of two-dimensional transmission linestructures[J].IEEE Trans. on Microwave Theory and Techniques.1990, 38(10):1433-1438[2]Gordon R K. A finite difference approach that employs anasymptotic boundary condition on a rectangular outer boundaryfor modeling two-dimensional transmission line structures[J].IEEE Trans. on Microwave Theory and Techniques.1993, 41(8):1280-1286[3]Mei K K. Measured equation of invariance: a new concept infield computations[J].IEEE Trans. on Antennas and Propagation.1994, 42(3):320-328[4]Liu Yaowu, Lan Kang, Mei K K. Capacitance extraction forelectrostatic multiconductor problems by on-surface MEI[J].IEEE Trans. on Advanced Packaging.2000, 23(3):489-494[5]Yu Wenjian, Wang Zeyi. A fast quasi-multiple medium methodfor 3-D BEM calculation of parasitic capacitance[J].Computers Mathematics with Applications.2003, 45(12):1883-1894[6]郝跃, 荆明娥, 马佩军. VLSI 集成电路参数成品率及优化研究进展[J]. 电子学报, 2003, 31(12A): 1971-1974.[7]Mikazuki T, Matsui N. Statistical design techniques forhigh-speed circuit boards with correlated structure distributions[J].IEEE Trans. on Components Packaging and ManufacturingTechnology.1994, 17(1):159-165[8]Oh S Y, Jung W Y, Kong J T, Lee K H. Interconnect modeling forVLSIs. Proc. Of SISPAD, Kyoto Japan, September 1999:203-206.[9]Lee Joo-Hee, Lee Keun-Ho, Park Jin-Kyu, Lee Jong . Bae, ParkYoung-Kwan, Kong Jeong-Taek, Jung Won-Young, Oh Soo-Young. An indirect extraction of interconnect technologyparameters for efficient statistical interconnect modeling and itsapplications. Statistical Metrology, 2000 5th InternationalWorkshop on, Honolulu, HI, USA, 11 June 2000: 38-41.[10]Liu Ying, Pileggi Lawrence T, Strojwas Andrzej J. Modelorder . reduction of RC(L) interconnect including variationalanalysis. Design Automation Conf. New Orleans, LA. 21 . 25June 1999: 201-206.[11]Wang J M, Ghanta P, Vrudhula S. Stochastic analysis ofinterconnect performance in the presence of process variations.IEEE/ACM International Conference on Computer Aided Design2004, San Jose, CA USA. 2004: 880-886.[12]殷显安. 实验模拟的蒙特卡洛方法[J]. 测试技术学报, 1994,8(2): 49-51.[13]徐勤卫, 李征帆, 陈文. 一种用于模拟高速互连线瞬态响应的高效数值方法[J]. 电子学报, 1999, 27(11): 114-116.[14]李鸿儒, 李征帆. 一种用于模拟高速VLSI中互连线瞬态响应的高效数值方法[J]. 上海交通大学学报, 2001, 35(6): 817-819,825.[15]齐磊, 卢铁兵, 崔翔. 端接非线性负载的非均匀传输线瞬态分析[J]. 电波科学学报, 2003, 18(2): 153-156.[16]唐旻, 马西奎. 一种用于分析高速VLSI中频变互连线瞬态响应的精细积分算法[J]. 电子学报,2004, 32(5): 788-790.[17]赵进全, 马西奎, 邱关源. 有损传输线时域响应分析的精细积分法[J]. 微电子学, 1997, 27(3): 180-185.[18]钟万勰. 暂态历程的精细计算方法[J]. 计算结构力学及其应用, 1995, 12(1): 1-6.
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出版历程
  • 收稿日期:  2004-12-13
  • 修回日期:  2005-05-23
  • 刊出日期:  2006-08-19

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