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理论分析毫米波螺旋线行波管慢波系统导体和介质损耗

郝保良 黄明光 刘濮鲲 肖刘 刘韦

郝保良, 黄明光, 刘濮鲲, 肖刘, 刘韦. 理论分析毫米波螺旋线行波管慢波系统导体和介质损耗[J]. 电子与信息学报, 2011, 33(2): 455-460. doi: 10.3724/SP.J.1146.2010.00249
引用本文: 郝保良, 黄明光, 刘濮鲲, 肖刘, 刘韦. 理论分析毫米波螺旋线行波管慢波系统导体和介质损耗[J]. 电子与信息学报, 2011, 33(2): 455-460. doi: 10.3724/SP.J.1146.2010.00249
Hao Bao-Liang, Huang Ming-Guang, Liu Pu-Kun, Xiao Liu, Liu Wei. Theoretical Analysis of Conductivity and Dielectric Attenuation in Millimeter-wave TWT Helical SWS[J]. Journal of Electronics and Information Technology, 2011, 33(2): 455-460. doi: 10.3724/SP.J.1146.2010.00249
Citation: Hao Bao-Liang, Huang Ming-Guang, Liu Pu-Kun, Xiao Liu, Liu Wei. Theoretical Analysis of Conductivity and Dielectric Attenuation in Millimeter-wave TWT Helical SWS[J]. Journal of Electronics and Information Technology, 2011, 33(2): 455-460. doi: 10.3724/SP.J.1146.2010.00249

理论分析毫米波螺旋线行波管慢波系统导体和介质损耗

doi: 10.3724/SP.J.1146.2010.00249
基金项目: 

国家自然科学基金重点项目(60931001)和国家自然科学基金(60801030)资助课题

Theoretical Analysis of Conductivity and Dielectric Attenuation in Millimeter-wave TWT Helical SWS

  • 摘要: 该文基于夹持杆分层螺旋带模型和3维电磁场模型分析,详细研究了毫米波螺旋线行波管慢波系统的导体和介质损耗。螺旋带模型中介质损耗考虑为纵向传播常数的虚部,给出电磁场的解析解,导体损耗由螺旋线和管壳表面的面电流不连续性获得。3维电磁场模型分析通过本征模法,求解单周期结构的品质因数和周期储能,获得有限导电率导体和夹持杆陶瓷损耗角带来的慢波系统高频损耗。结果表明,毫米波段螺旋线的导体损耗和夹持杆的介质损耗远大于管壳导体损耗,介质损耗与陶瓷损耗角呈线性关系,对高频损耗的影响不可忽略。
  • Chong C K, Layman D, and Le Borgne R H, et al.. Development of high-power Ka and Q dual-band and communications or radar dual-function helix-TWT [J].IEEE Transactions on Electron Devices.2009, 56(5):913-918[2]Dialetis D, Chernin D, and Antonsen T M Jr, et al.. Accurate representation of attenuation in Helix TWT Simulation Codes [J].IEEE Transactions on Electron Devices.2009, 56(5):935-944[3]Datta S K, Kumar L, and Basu B N. A simple and accurate analysis of conductivity loss in millimeter-wave helical slow-wave structures[J].Journal of Infrared, Millimeter, and Terahertz Waves.2009, 30(4):381-392[4]Duan Zhao-yun, Gong Yu-bin, Wang Wen-xiang, and Wei Yan-yu. Investigation into the effect of dielectric loss on RF characteristics of helical SWS[J]. Journal of Infrared, Millimeter, and Terahertz Waves, 2008, 29(1): 23-34.[5]Gilmour A S, Gillette M R, and Chen J T. Theoretical and experimental TWT helix loss determination[J].IEEE Transactions on Electron Devices.1979, 26(10):1581-1588[6]Sensiper S. Electromagnetic wave propagation on helical conductors [D]. [Ph.D. dissertation], Dept. of Electrical Engineering, MIT, May 1951.[7]Ghosh S, Jain P K, and Basu B N. Rigorous tape analysis of inhomogeneously-loaded helical slow wave structures[J].IEEE Transactions on Electron Devices.1997, 44(7):1158-1168[8]Cheinin D, Antonsen T M Jr, and Levush B. Exact treatment of the dispersion and beam interaction impedance of a thin tape helix surrounded by a radially stratified dielectric[J].IEEE Transactions on Electron Devices.1999, 46(7):1472-1482[9]Naidu V B, Datta S K, and Ramana P R, et al.. Three-dimensional electromagnetic analysis of attenuator- coated helix support rods of a traveling-wave tube[J].IEEE Transactions on Electron Devices.2009, 56(5):945-950[10]Kory C L. Three-dimensional simulation of helix traveling- wave tube cold-test characteristics using MAFIA [J].IEEE Transactions on Electron Devices.1996, 43(8):1317-1319[11]Aloisio M and Waller P. Analysis of helical slow-wave structures for space TWTs Using 3-D electromagnetic simulators [J].IEEE Transactions on Electron Devices.2005, 52(5):749-754[12] Ansoft HFSS User Manual. www.hfss.com, 2009.[13]Quarteroni A, Sacco R, and Saleri F. Numerical Mathematics [M], Beijing: Science Press, 2006: 267-275.[14] CST MWS User Manual. www.cst.com, 2009.[15]Cooke S J, Mondelli A , and Levush B, et al.. CTLSSan advanced electromagnetic simulation tool for designing high-power microwave sources [J].IEEE Transactions on Plasma Science.2000, 28(3):841-866[16]Xu Li, Yang ZhongHai, and Li Bin. High-frequency circuit simulator: an advanced three-dimensional finite-element electromagnetic-simulation tool for microwave tubes [J].IEEE Transactions on Electron Devices.2009, 56(5):1141-1151[17]王文祥. 微波工程技术[M]. 北京:国防工业出版社,2009: 198-200.[18]肖刘, 苏小保, 刘濮鲲. 螺旋带色散特性和耦合阻抗的精确计算[J].电子与信息学报.2007, 29(3):751-755浏览Xiao Liu, Su Xiao-bao, and Liu Pu-kun. Precise calculation of the dispersion and coupling impedance of tape helix [J]. Journal of Electronics & Information Technology, 2007, 29(3): 751-755.[19]高陇桥. 氧化铍陶瓷[M]. 北京:冶金工业出版社, 2006: 80-82.[20]刘联宝, 戴昌鼎. 电真空器件的钎焊与陶瓷金属封接[M]. 北京:国防工业出版社, 1978: 18-19.[21]Goren Y, Schram A, Gagne D, and Jensen C. Accurate measurements of the dielectric properties of TWT BeO support rods[C]. IVEC, Tokyo, Japan, 2007: 1-2.[22]Seo W B and Choi J J. Dielectric measurements using fabry- perot open resonators at millimeter wave frequencies (26-110 GHz) [C]. IVEC, Monterey, California, USA, 2002: 373-374.
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出版历程
  • 收稿日期:  2010-03-18
  • 修回日期:  2010-10-08
  • 刊出日期:  2011-02-19

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